Cascode 型GaN 功率器件的开关过程及损耗分析 |
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Improving Performances of Enhancement-Mode AlGaN/GaN MIS-HEMTs on 6-inch Si Substrate Utilizing SiON/Al2O3 Stack Dielectrics |
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Gate-first AlGaN/GaN HEMT technology for enhanced threshold voltage stability based on MOCVD-grown in situ SiNx |
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Temperature-Dependent Hot Electron Effects and Degradation Mechanisms in 650-V GaN-Based MIS-HEMT Power Devices Under Hard Switching Operations |
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Effects of SiON/III-nitride interface properties on device performances of GaN-based power field-effect transistors |
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Effects of substrate termination on Ron increase under stress in 650 V GaN power devices |
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Improving Gate Reliability of 6-In E-Mode GaN-Based MIS-HEMTs by Employing Mixed Oxygen and Fluorine Plasma Treatment |
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